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Automatic Test Cells2019-02-13T05:43:42+00:00

Automatic Test Cells

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Modules testing: High Power Modules test cell

  • SCARA robot based motion system
  • Optional tools, nozzles, grippers, based on device type
  • Heating (up to 200°C) and cooling (25°C) plates available
  • Specific contacting unit for power devices (High Voltage /High Current)
  • Full system integration to reduces connection parasitic effects
  • Fully programmable output sorting (up to 4 different categories)
  • Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
  • Fully integrated Tester-Handler SW protocol
  • Easy to use SW based on touch screen
  • Multilevel password access

Chip testing: KGD test cell

  • Distributed synchronized motion and vision control system
  • Multiple up or down looking, moving or fix installed cameras (GigE) Head- and table peripherals from flexible component matrix
  • Optional tools, nozzles, grippers (changers, heaters, force systems)
  • Specific contacting unit for HV devices
  • Optional conveyors, tape- and stick feeders, vibratory-, any-feed-, wafer and waffle-pack feeders
  • Full system integration to reduces connection parasitic effects
  • Fully programmable output sorting (up to 4 different categories)
  • Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
  • Fully integrated Tester-Handler SW protocol
  • Easy to use SW based on touch screen
  • Multilevel password access

Discrete devices: TO247 test cell

  • Flexible feeding type trolley based (possible to change magazine setup in 5 minutes: Tube2Tube to Jedec2Jedec or Blister)
  • Sensorized pickup tool for accurate device pickup and placement
  • High Tester-Handler integration level to reduces connection parasitic effects
  • Double pick up tool and double device socket to optimize handling time
  • Optical check for 2D code check on socket (to automatically verify the right configuration recipe-socket)
  • Fully programmable reject bin in Box (up to 5 different boxes)
  • Ready for Factory automation (STDF compliant, SECS GEM and MES optional)
  • Fully integrated Tester-Handler SW protocol
  • Easy to use SW based on touch screen
  • Multilevel password access
  • ESD Compliance with ionizer

Automatic Test Cells – MTS100SW

STATIC VERIFICATIONS:

  • Iges,Igds,Vgeth,Vgsth: ± 30V/1A or ± 50V/0.1A
  • Ices,Idrm,Irrm, Bvces,Vrrm,Vdrm: 2.3KV /50mA or 7.5KV/10mA
  • Vceon/Vdson, Vf: up 200A/10V)
  • Kelvin tests performed continuity check
  • Up to 100 tests in a single run
  • Results data collection, export and statistical analysis, BIN summary, Wafer summery
  • Flexible Test program: test sequence based on partial results (Jump on Pass/Fail)
  • Classes can be defined upon test results using the Matching editor.
  • TTL/GPIB wafer prober interface